Search results for "Fault detection and identification"

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory

2017

Defect localization in Very Large Integration Cir-cuits (VLSI) requires to use multi-sensor information such aselectrical waveforms, emission microscopy images and frequencymapping in order to detect, localize and identify the failure. Eachsensor provides a specific kind of feature modeling the evidence.Thus, the defect localization in VLSI can be summarized asa problem of data fusion with heterogeneous and impreciseinformation. This study illustrates how to reproduce the humandecision for modeling and fusing the different multi-sensorfeatures by using the Demspter-Shafer theory. We propose notonly an automatic decision rule for mass functions computingbut also confidence intervals to quantif…